Originally posted by ivconic
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Originally posted by Carl-NC View Post
Yes, you could probably design some kind of fast shoot-through sensor and, with a lot of extra circuitry, figure out a way to deal with the problem. But again, why not just take advantage of the micro and do it the easy way? And yes, I always include lock-up protection in the TX by capacitor-coupling the TX clocks. I haven't shown that yet, but it's in the actual design schematic, which is unfinished. The exact timing is TBD, I won't know that until I build the circuit.
Coil resistance almost solely determines power consumption so you want it as low as possible.
(That's the Carl character I was talking about; everything in a sentence that can be shortened; he will cut it short! He is very sparing of letters!)
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"...Coil resistance almost solely determines power consumption so you want it as low as possible..."
Low as possible... what? Power consumption or coil resistance?
Because lowest possible coil resistance will lead to highest possible power consumption and vice versa!
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No, I was thinking; in order to protect fets: is safer if coil resistance is higher...
But than again; the current will be low(er).
And that's something, I assume; you don't want here?
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Originally posted by ivconic View Post...
No, I was thinking; in order to protect fets: is safer if coil resistance is higher...
But than again; the current will be low(er).
And that's something, I assume; you don't want here?[/FONT]
As to the coil resistance, I think you need it as low as possible. The higher the coil resistance, the more current is lost as heat.
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Originally posted by lucifer View Post
Coil resistance won't help you protect the FETs. The shoot-through current is the current that flows from positive to negative terminal passing only through the FETs (and not through the coil). And since FETs have very low ON resistance that is quite the same as a short circuit. This is why you need the dead times in the clock pulses that drive the FETs.
As to the coil resistance, I think you need it as low as possible. The higher the coil resistance, the more current is lost as heat.
Now I understand, thanks!
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I have to use TLAs, I'm a slow typist.
Power consumption is proportional to coil resistance for a given TX current. Suppose I want a peak current of 500mA (peak-to-peak = 1A) and coil R=2Ω; also assume the FET switches are ideal, and there are no diode drops. VTX will need to be 1V (0.5A*2Ω) and power dissipated by the coil is 0.5W. Note that the power delivered by VTX is also 0.5W because there are no other losses in the circuit. Now suppose I wind a coil with R=4Ω... VTX needs to be 2V to achieve 0.5A and power dissipated is 1W.
In reality there are a couple of diode drops and the FET switches have a very minor amount of resistance. But coil resistance sets the pace. Keep in mind this is a constant-current TX circuit, not constant voltage. Also, Lucifer nailed the shoot-through issue.
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Originally posted by Carl-NC View Post
So the correction granularity will depend on the micro clock. The plot above suggests that a 100MHz micro will get you within +/- 10uA of perfect.
A difference of 10µA generates a difference of ADC voltage of 10µV. This is 3.3V/10µV = 330000, so a part over 330000 or 3 ppm.
This needs an ADC precision of 15 bits.
If using standard integrated ADC of 12 bits, we shall need to apply a digital integration to gain the missing 3 bits. That means summing 4^3 = 64 consecutive periods before using the integrated error measurement.
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Originally posted by Willy Bayot View Post
About the error mesasurement, to get a precision of +- 10µA, we need to be able to measure the difference between the two end of the slope with enough precision.
A difference of 10µA generates a difference of ADC voltage of 10µV. This is 3.3V/10µV = 330000, so a part over 330000 or 3 ppm.
This needs an ADC precision of 15 bits.
If using standard integrated ADC of 12 bits, we shall need to apply a digital integration to gain the missing 3 bits. That means summing 4^3 = 64 consecutive periods before using the integrated error measurement.
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Originally posted by Olly View Post
Perhaps we would be better off by amplifying the difference between the two signals first and then presenting that to the ADC
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Originally posted by Willy Bayot View Post
No way, the two values to measure do not appear at the same time. Thus, it is not possible to make the difference with an analog circuit and then, amplify it.
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Originally posted by Olly View Post
I was talking about amplifying the difference between the two sampled and integrated values of course…
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Originally posted by Olly View Post
To clarify, I’m suggesting a differential amplification of the 2 sampled signals TXV1and TXV2 from Carl’s schematic. No reason this should not be possible.
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Willy is correct. The resolution of the 12b ADC is 0.8mV which corresponds to 0.8mA of tilt. If we want better tilt accuracy, more analog gain is needed. But we don't want to apply much more gain to the peak current reading; currently it is scaled to 1V/A with (again) a resolution of 0.8mA, which is about right for controlling the peak. It could probably be multiplied by another 2x (2V/A) but no more.
Olly is also correct; we can solve this by subtracting the samples and applying more gain to the difference. We do this all the time in PI by subtracting the EFE sample from the main sample, even though they don't occur at the same time. The only reason you would not want to do this is if you are trying to correct tilt at a pulse-by-pulse speed, which is probably not realistic. Like automatic ground tracking, you do it over a short span of time. So we can assume a sampling tau of at least 10s or 100s of half-cycles.
Here is a circuit that should solve this:
I've posted complete schematics here so I will make changes, pending feedback.
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Originally posted by Carl-NC View PostWe do this all the time in PI by subtracting the EFE sample from the main sample, even though they don't occur at the same time.
So we can assume a sampling tau of at least 10s or 100s of half-cycles.
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